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60 pages • missing pub info (view editions)
ISBN/UID: 9783659693496
Format: Paperback
Language: English
Publisher: LAP Lambert Academic Publishing
Edition Pub Date: 16 June 2015
Description
Over the past few decades, reliability has grown to become an important design attribute of critical electronic systems. Reliability is embedded into systems during design phase itself and improved by means of failure analysis & testing. Howev...
Community Reviews
Content Warnings
60 pages • missing pub info (view editions)
ISBN/UID: 9783659693496
Format: Paperback
Language: English
Publisher: LAP Lambert Academic Publishing
Edition Pub Date: 16 June 2015
Description
Over the past few decades, reliability has grown to become an important design attribute of critical electronic systems. Reliability is embedded into systems during design phase itself and improved by means of failure analysis & testing. Howev...
Community Reviews
Content Warnings